第14回
プラント DiD リスクモニタの多用途応用の展望
著者:
吉川 榮和,Hidekazu YOSHIKAWA,中川 隆志,Takashi NAKAGAWA,寺下 尚孝,Naotaka TERASHITA,馬 戦国,Zhanguo MA
発刊日:
公開日:
キーワードタグ:
A new risN monitor system has been under development which can be applied not only to prevent severe accident in daily operation but also to serve to mitigate radiological hazard just after severe accident happens. The system is composed by plant DiD (Defence-in Depth) risN monitor and reliability monitor. The plant DiD risN monitor can describe versatile scenarios of human-machine interaction in accident situation by utilizing UML (Unified Modeling Language) so as to serve as a useful tool of accident m...
英字タイトル:
A prospective review on multi-purpose application of plant DiD risN monitor